Atomic-force microscopy (AFM) or scanning-force Microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
AFM provides a 3D profile of the surface on a nanoscale, by measuring forces between a sharp probe (<10 nm) and surface at very short distance (0.2-10 nm probe-sample separation). The probe is supported on a flexible cantilever. The AFM tip ?gently? touches the surface and records the small force between the probe and the surface.
Atomic force microscopy is arguably the most versatile and powerful microscopy technology for studying samples at nanoscale. It is versatile because an atomic force microscope can not only image in three-dimensional topography, but it also provides various types of surface measurements to the needs of scientists and engineers. It is powerful because an AFM can generate images at atomic resolution with angstrom scale resolution height information, with minimum sample preparation.
The main markets for AFM are academia, research labs and the semiconductors and electronics sector, with growing markets in biology and the life sciences and nanotechnology and nanomaterials research. In semiconductors, the measurement and manipulation of nanomaterials becomes increasingly challenging as the continuous shrinking of dimensions requires higher lateral resolution. The AFM has become a standard and widely spread instrument for characterizing such nanoscale devices and can be found in most of today?s research and development areas.
Increasing government and corporate funding in life sciences and nanotechnology is predominantly driving the microscopy market. Furthermore, technological advances that enhance ease of usage, automation, better quality imaging, faster and better analysis have also had a huge positive impact on the market.
However, the characterization of three dimensional high-aspect ratio and sidewall structures can prove problematic. And there are other microscopes can be used to replace AFM, like SNOM (Near-field scanning optical microscopy).
According to this study, over the next five years the Atomic Force Microscope market will register a 3.7% CAGR in terms of revenue, the global market size will reach USD 400 million by 2024, from USD 320 million in 2019. In particular, this report presents the global revenue market share of key companies in Atomic Force Microscope business, shared in Chapter 3.
This report presents a comprehensive overview, market shares and growth opportunities of Atomic Force Microscope market by product type, application, key companies and key regions.
This study considers the Atomic Force Microscope value generated from the sales of the following segments-
Segmentation by product type- breakdown data from 2014 to 2019 in Section 2.3; and forecast to 2024 in section 10.7.
Research Grade AFM
Industrial Grade AFM
Segmentation by application- breakdown data from 2014 to 2019, in Section 2.4; and forecast to 2024 in section 10.8.
Life Sciences and Biology
Semiconductors and Electronics
Nanomaterials Science
Other
This report also splits the market by region- Breakdown data in Chapter 4, 5, 6, 7 and 8.
Americas
United States
Canada
Mexico
Brazil
APAC
China
Japan
Korea
Southeast Asia
India
Australia
Europe
Germany
France
UK
Italy
Russia
Spain
Middle East & Africa
Egypt
South Africa
Israel
Turkey
GCC Countries
The report also presents the market competition landscape and a corresponding detailed analysis of the major vendor/manufacturers in the market. The key manufacturers covered in this report- Breakdown data in in Chapter 3.
Bruker Corporation
JPK Instruments
NT-MDT
Keysight Technologies
Park Systems
Witec
Asylum Research (Oxford Instruments)
Nanonics Imaging
Nanosurf
Hitachi High-Technologies
Anasys Instruments
RHK Technology
A.P.E. Research
In addition, this report discusses the key drivers influencing market growth, opportunities, the challenges and the risks faced by key players and the market as a whole. It also analyzes key emerging trends and their impact on present and future development.
Research objectives
To study and analyze the global Atomic Force Microscope market size by key regions/countries, product type and application, history data from 2014 to 2018, and forecast to 2024.
To understand the structure of Atomic Force Microscope market by identifying its various subsegments.
Focuses on the key global Atomic Force Microscope players, to define, describe and analyze the value, market share, market competition landscape, SWOT analysis and development plans in next few years.
To analyze the Atomic Force Microscope with respect to individual growth trends, future prospects, and their contribution to the total market.
To share detailed information about the key factors influencing the growth of the market (growth potential, opportunities, drivers, industry-specific challenges and risks).
To project the size of Atomic Force Microscope submarkets, with respect to key regions (along with their respective key countries).
To analyze competitive developments such as expansions, agreements, new product launches and acquisitions in the market.
To strategically profile the key players and comprehensively analyze their growth strategies.
